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Investigation on energy bandgap states of amorphous SiZnSnO thin films.
Sci Rep. 2019 Dec 17;9(1):19246. doi: 10.1038/s41598-019-55807-2.
Sci Rep. 2019.
PMID: 31848440
Free PMC article.
Mechanism of carrier controllability with metal capping layer on amorphous oxide SiZnSnO semiconductor.
Lee BH, Sohn A, Kim S, Lee SY.
Lee BH, et al.
Sci Rep. 2019 Jan 29;9(1):886. doi: 10.1038/s41598-018-37530-6.
Sci Rep. 2019.
PMID: 30696893
Free PMC article.
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