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K-shell radiative electron capture with bare 60-MeV/u Kr ions channeled in a Si crystal: Experiments and simulations.
Andriamonje S, Chevallier M, Cohen C, Cue N, Dauvergne D, Dural J, Fujimoto F, Kirsch R, L'Hoir A, Poizat J, Quéré Y, Remillieux J, Röhl C, Rothard H, Rozet JP, Schmaus D, Toulemonde M, Vernhet D. Andriamonje S, et al. Among authors: schmaus d. Phys Rev A. 1996 Aug;54(2):1404-1416. doi: 10.1103/physreva.54.1404. Phys Rev A. 1996. PMID: 9913606 No abstract available.
Observation of radiative electron capture into K,L,M shells of 25-MeV/u Xe53+ ions channeled in silicon.
Andriamonje S, Chevallier M, Cohen C, Dural J, Gaillard MJ, Genre R, Hage-Ali M, Kirsch R, L'Hoir A, Mazuy D, Mory J, Moulin J, Poizat JC, Remillieux J, Schmaus D, Toulemonde M. Andriamonje S, et al. Among authors: schmaus d. Phys Rev Lett. 1987 Nov 16;59(20):2271-2274. doi: 10.1103/PhysRevLett.59.2271. Phys Rev Lett. 1987. PMID: 10035500 No abstract available.
Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
Andriamonje S, Anne R, de Castro Faria NV, Chevallier M, Cohen C, Dural J, Gaillard MJ, Genre R, Hage-Ali M, Kirsch R, L'Hoir A, Farizon-Mazuy B, Mory J, Moulin J, Poizat JC, Quéré Y, Remillieux J, Schmaus D, Toulemonde M. Andriamonje S, et al. Among authors: schmaus d. Phys Rev Lett. 1989 Oct 30;63(18):1930-1933. doi: 10.1103/PhysRevLett.63.1930. Phys Rev Lett. 1989. PMID: 10040717 No abstract available.
Kossel Effect in Periodic Multilayers.
Guen KL, André JM, Wu M, Ilakovac V, Delmotte F, Rossi S, Bridou F, Meltchakov E, Giglia A, Nannarone S, Wang Z, Huang Q, Zhang Z, Zhu J, Tu Y, Yuan Y, Vickridge I, Schmaus D, Briand E, Steydli S, Walter P, Jonnard P. Guen KL, et al. Among authors: schmaus d. J Nanosci Nanotechnol. 2019 Jan 1;19(1):593-601. doi: 10.1166/jnn.2019.16472. J Nanosci Nanotechnol. 2019. PMID: 30327074
Computer security and data confidentiality.
Schmaus D. Schmaus D. AORN J. 1991 Oct;54(4):885-90. doi: 10.1016/s0001-2092(07)68209-x. AORN J. 1991. PMID: 1952911 No abstract available.
The basics of bar code technology.
Schmaus D. Schmaus D. AORN J. 1991 Jun;53(6):1542-8. doi: 10.1016/s0001-2092(07)68995-9. AORN J. 1991. PMID: 1863070 No abstract available.
18 results