Low-Frequency Noise Related to the Scattering Effect in p-Type Copper(I) Oxide Thin-Film Transistors.
Yoo J, Park S, Lee H, Lim S, Song H, Park M, Kim S, Jeong JH, Bong J, Heo K, Lee K, Kim T, Ye PD, Bae H.
Yoo J, et al. Among authors: lee h, lee k.
ACS Appl Mater Interfaces. 2025 Jan 15;17(2):3538-3547. doi: 10.1021/acsami.4c14876. Epub 2024 Dec 31.
ACS Appl Mater Interfaces. 2025.
PMID: 39740115