Defect detection of printed circuit board assembly based on YOLOv5.
Shen M, Liu Y, Chen J, Ye K, Gao H, Che J, Wang Q, He H, Liu J, Wang Y, Jiang Y.
Shen M, et al. Among authors: chen j.
Sci Rep. 2024 Aug 20;14(1):19287. doi: 10.1038/s41598-024-70176-1.
Sci Rep. 2024.
PMID: 39164348
Free PMC article.