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Fast and efficient hard X-ray projection imaging below 10 nm resolution.
Zhang W, Dresselhaus JL, Fleckenstein H, Prasciolu M, Zakharova M, Ivanov N, Li C, Yefanov O, Li T, Egorov D, De Gennaro Aquino I, Middendorf P, Hagemann J, Shi S, Bajt S, Chapman HN. Zhang W, et al. Among authors: li c, li t. Opt Express. 2024 Aug 12;32(17):30879-30897. doi: 10.1364/OE.532037. Opt Express. 2024. PMID: 39573237 Free article.
Robust ptychographic X-ray speckle tracking with multilayer Laue lenses.
Ivanov N, Lukas Dresselhaus J, Carnis J, Domaracky M, Fleckenstein H, Li C, Li T, Prasciolu M, Yefanov O, Zhang W, Bajt S, Chapman HN. Ivanov N, et al. Among authors: li c, li t. Opt Express. 2022 Jul 4;30(14):25450-25473. doi: 10.1364/OE.460903. Opt Express. 2022. PMID: 36237075 Free article.
X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses.
Dresselhaus JL, Zakharova M, Ivanov N, Fleckenstein H, Prasciolu M, Yefanov O, Li C, Zhang W, Middendorf P, Egorov D, De Gennaro Aquino I, Chapman HN, Bajt S. Dresselhaus JL, et al. Among authors: li c. Opt Express. 2024 Apr 22;32(9):16004-16015. doi: 10.1364/OE.518964. Opt Express. 2024. PMID: 38859238 Free article.
Imaging via Correlation of X-Ray Fluorescence Photons.
Trost F, Ayyer K, Prasciolu M, Fleckenstein H, Barthelmess M, Yefanov O, Dresselhaus JL, Li C, Bajt S, Carnis J, Wollweber T, Mall A, Shen Z, Zhuang Y, Richter S, Karl S, Cardoch S, Patra KK, Möller J, Zozulya A, Shayduk R, Lu W, Brauße F, Friedrich B, Boesenberg U, Petrov I, Tomin S, Guetg M, Madsen A, Timneanu N, Caleman C, Röhlsberger R, von Zanthier J, Chapman HN. Trost F, et al. Among authors: li c. Phys Rev Lett. 2023 Apr 28;130(17):173201. doi: 10.1103/PhysRevLett.130.173201. Phys Rev Lett. 2023. PMID: 37172237
89,704 results
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