Extended-depth of field random illumination microscopy, EDF-RIM, provides super-resolved projective imaging.
Mazzella L, Mangeat T, Giroussens G, Rogez B, Li H, Creff J, Saadaoui M, Martins C, Bouzignac R, Labouesse S, Idier J, Galland F, Allain M, Sentenac A, LeGoff L.
Mazzella L, et al. Among authors: legoff l.
Light Sci Appl. 2024 Oct 10;13(1):285. doi: 10.1038/s41377-024-01612-0.
Light Sci Appl. 2024.
PMID: 39384765
Free PMC article.