Kim SK - Search Results

1

Atomic Layer Growth of Rutile TiO₂ Films with Ultrahigh Dielectric Constants via Crystal Orientation Engineering.

Kim T, Jeon J, Ryu SH, Chung HK, Jang M, Lee S, Chung YJ, Kim SK. Kim T, et al. Among authors: kim sk. ACS Appl Mater Interfaces. 2024 Jul 3;16(26):33877-33884. doi: 10.1021/acsami.4c08379. Epub 2024 Jun 18. ACS Appl Mater Interfaces. 2024. PMID: 38961576

2

Impact of bimetal electrodes on dielectric properties of TiO2 and Al-doped TiO2 films.

Kim SK, Han S, Jeon W, Yoon JH, Han JH, Lee W, Hwang CS. Kim SK, et al. ACS Appl Mater Interfaces. 2012 Sep 26;4(9):4726-30. doi: 10.1021/am301094t. Epub 2012 Aug 16. ACS Appl Mater Interfaces. 2012. PMID: 22869517

3

Controlling the Al-doping profile and accompanying electrical properties of rutile-phased TiO2 thin films.

Jeon W, Rha SH, Lee W, Yoo YW, An CH, Jung KH, Kim SK, Hwang CS. Jeon W, et al. Among authors: kim sk. ACS Appl Mater Interfaces. 2014 May 28;6(10):7910-7. doi: 10.1021/am501247u. Epub 2014 May 1. ACS Appl Mater Interfaces. 2014. PMID: 24749990

4

Nonvolatile resistance switching on two-dimensional electron gas.

Joung JG, Kim SI, Moon SY, Kim DH, Gwon HJ, Hong SH, Chang HJ, Hwang JH, Kwon BJ, Kim SK, Choi JW, Yoon SJ, Kang CY, Yoo KS, Kim JS, Baek SH. Joung JG, et al. Among authors: kim dh, kim si, kim sk, kim js. ACS Appl Mater Interfaces. 2014 Oct 22;6(20):17785-91. doi: 10.1021/am504354c. Epub 2014 Oct 3. ACS Appl Mater Interfaces. 2014. PMID: 25243475

5

Evaluating the top electrode material for achieving an equivalent oxide thickness smaller than 0.4 nm from an Al-doped TiO₂ film.

Jeon W, Yoo S, Kim HK, Lee W, An CH, Chung MJ, Cho CJ, Kim SK, Hwang CS. Jeon W, et al. Among authors: kim hk, kim sk. ACS Appl Mater Interfaces. 2014 Dec 10;6(23):21632-7. doi: 10.1021/am506677e. Epub 2014 Nov 25. ACS Appl Mater Interfaces. 2014. PMID: 25402821

6

Structure and electrical properties of Al-doped HfO₂ and ZrO₂ films grown via atomic layer deposition on Mo electrodes.

Yoo YW, Jeon W, Lee W, An CH, Kim SK, Hwang CS. Yoo YW, et al. Among authors: kim sk. ACS Appl Mater Interfaces. 2014 Dec 24;6(24):22474-82. doi: 10.1021/am506525s. Epub 2014 Dec 4. ACS Appl Mater Interfaces. 2014. PMID: 25423483

7

Control of the initial growth in atomic layer deposition of Pt films by surface pretreatment.

Pyeon JJ, Cho CJ, Baek SH, Kang CY, Kim JS, Jeong DS, Kim SK. Pyeon JJ, et al. Among authors: kim sk, kim js. Nanotechnology. 2015 Jul 31;26(30):304003. doi: 10.1088/0957-4484/26/30/304003. Epub 2015 Jul 8. Nanotechnology. 2015. PMID: 26154699

8

Atomic-Layer Deposition of Single-Crystalline BeO Epitaxially Grown on GaN Substrates.

Lee SM, Yum JH, Yoon S, Larsen ES, Lee WC, Kim SK, Shervin S, Wang W, Ryou JH, Bielawski CW, Oh J. Lee SM, et al. Among authors: kim sk. ACS Appl Mater Interfaces. 2017 Dec 6;9(48):41973-41979. doi: 10.1021/acsami.7b13487. Epub 2017 Nov 27. ACS Appl Mater Interfaces. 2017. PMID: 29148718

9

High-Performance Thin-Film Transistors of Quaternary Indium-Zinc-Tin Oxide Films Grown by Atomic Layer Deposition.

Baek IH, Pyeon JJ, Han SH, Lee GY, Choi BJ, Han JH, Chung TM, Hwang CS, Kim SK. Baek IH, et al. Among authors: kim sk. ACS Appl Mater Interfaces. 2019 Apr 24;11(16):14892-14901. doi: 10.1021/acsami.9b03331. Epub 2019 Apr 15. ACS Appl Mater Interfaces. 2019. PMID: 30945837

10

Precision Interface Engineering of an Atomic Layer in Bulk Bi₂Te₃ Alloys for High Thermoelectric Performance.

Kim KC, Lim SS, Lee SH, Hong J, Cho DY, Mohamed AY, Koo CM, Baek SH, Kim JS, Kim SK. Kim KC, et al. Among authors: kim sk, kim js. ACS Nano. 2019 Jun 25;13(6):7146-7154. doi: 10.1021/acsnano.9b02574. Epub 2019 Jun 10. ACS Nano. 2019. PMID: 31180627

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