Multiphase Reset Induced Reliable Dual-Mode Resistance Switching of the Ta/HfO2/RuO2 Memristor.
Shin DH, Park H, Ghenzi N, Kim YR, Cheong S, Shim SK, Yim S, Park TW, Song H, Lee JK, Kim BS, Park T, Hwang CS.
Shin DH, et al. Among authors: park t, park h, park tw.
ACS Appl Mater Interfaces. 2024 Apr 3;16(13):16462-16473. doi: 10.1021/acsami.3c19523. Epub 2024 Mar 21.
ACS Appl Mater Interfaces. 2024.
PMID: 38513155