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Button shear testing for adhesion measurements of 2D materials.
Nat Commun. 2024 Mar 18;15(1):2430. doi: 10.1038/s41467-024-46136-8.
Nat Commun. 2024.
PMID: 38499534
Free PMC article.
Zero-Bias Power-Detector Circuits based on MoS2 Field-Effect Transistors on Wafer-Scale Flexible Substrates.
Reato E, Palacios P, Uzlu B, Saeed M, Grundmann A, Wang Z, Schneider DS, Wang Z, Heuken M, Kalisch H, Vescan A, Radenovic A, Kis A, Neumaier D, Negra R, Lemme MC.
Reato E, et al.
Adv Mater. 2022 Dec;34(48):e2108469. doi: 10.1002/adma.202108469. Epub 2022 Feb 17.
Adv Mater. 2022.
PMID: 35075681
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