Imaging Threading Dislocations and Surface Steps in Nitride Thin Films Using Electron Backscatter Diffraction.
Hiller KP, Winkelmann A, Hourahine B, Starosta B, Alasmari A, Feng P, Wang T, Parbrook PJ, Zubialevich VZ, Hagedorn S, Walde S, Weyers M, Coulon PM, Shields PA, Bruckbauer J, Trager-Cowan C.
Hiller KP, et al. Among authors: coulon pm.
Microsc Microanal. 2023 Dec 21;29(6):1879-1888. doi: 10.1093/micmic/ozad118.
Microsc Microanal. 2023.
PMID: 37947075
Free article.