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Electrically driven redox process in cerium oxides.
Gao P, Kang Z, Fu W, Wang W, Bai X, Wang E. Gao P, et al. Among authors: wang w, wang e. J Am Chem Soc. 2010 Mar 31;132(12):4197-201. doi: 10.1021/ja9086616. J Am Chem Soc. 2010. PMID: 20218562
Direct observations of retention failure in ferroelectric memories.
Gao P, Nelson CT, Jokisaari JR, Zhang Y, Baek SH, Bark CW, Wang E, Liu Y, Li J, Eom CB, Pan X. Gao P, et al. Among authors: wang e. Adv Mater. 2012 Feb 21;24(8):1106-10. doi: 10.1002/adma.201103983. Adv Mater. 2012. PMID: 22331626 Free article.
8,462 results