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Focused electron beam induced etching of titanium with XeF2.
Schoenaker FJ, Córdoba R, Fernández-Pacheco R, Magén C, Stéphan O, Zuriaga-Monroy C, Ibarra MR, De Teresa JM. Schoenaker FJ, et al. Among authors: stephan o. Nanotechnology. 2011 Jul 1;22(26):265304. doi: 10.1088/0957-4484/22/26/265304. Epub 2011 May 18. Nanotechnology. 2011. PMID: 21586811
Unveiling nanometer scale extinction and scattering phenomena through combined electron energy loss spectroscopy and cathodoluminescence measurements.
Losquin A, Zagonel LF, Myroshnychenko V, Rodríguez-González B, Tencé M, Scarabelli L, Förstner J, Liz-Marzán LM, García de Abajo FJ, Stéphan O, Kociak M. Losquin A, et al. Among authors: stephan o. Nano Lett. 2015 Feb 11;15(2):1229-37. doi: 10.1021/nl5043775. Epub 2015 Jan 20. Nano Lett. 2015. PMID: 25603194 Free article.
Event-based hyperspectral EELS: towards nanosecond temporal resolution.
Auad Y, Walls M, Blazit JD, Stéphan O, Tizei LHG, Kociak M, De la Peña F, Tencé M. Auad Y, et al. Among authors: stephan o. Ultramicroscopy. 2022 Sep;239:113539. doi: 10.1016/j.ultramic.2022.113539. Epub 2022 May 13. Ultramicroscopy. 2022. PMID: 35598348
127 results