Stolz W - Search Results

1

Zero-phonon lines of nitrogen-cluster states in GaN _x As_1-x : H identified by time-resolved photoluminescence.

Hantke K, Horst S, Chatterjee S, Klar PJ, Volz K, Stolz W, Rühle WW, Masia F, Pettinari G, Polimeni A, Capizzi M. Hantke K, et al. Among authors: stolz w. J Mater Sci. 2008;43(12):4344-4347. doi: 10.1007/s10853-008-2643-9. Epub 2008 Jun 1. J Mater Sci. 2008. PMID: 34341608 Free PMC article. No abstract available.

2

Characterization of solar cells by photocurrent spectroscopy and current-voltage characteristics with high spatial resolution.

Schwalm M, Lange C, Rühle WW, Stolz W, Volz K, Chatterjee S. Schwalm M, et al. Among authors: stolz w. Opt Express. 2010 Mar 15;18(6):6277-87. doi: 10.1364/OE.18.006277. Opt Express. 2010. PMID: 20389651 Free article.

3

Electron mass in dilute nitrides and its anomalous dependence on hydrostatic pressure.

Pettinari G, Polimeni A, Masia F, Trotta R, Felici M, Capizzi M, Niebling T, Stolz W, Klar PJ. Pettinari G, et al. Among authors: stolz w. Phys Rev Lett. 2007 Apr 6;98(14):146402. doi: 10.1103/PhysRevLett.98.146402. Epub 2007 Apr 2. Phys Rev Lett. 2007. PMID: 17501294

4

Tuning the magnetic properties of GaAs:Mn/MnAs hybrids via the MnAs cluster shape.

Krug von Nidda HA, Kurz T, Loidl A, Hartmann T, Klar PJ, Heimbrodt W, Lampalzer M, Volz K, Stolz W. Krug von Nidda HA, et al. Among authors: stolz w. J Phys Condens Matter. 2006 Jul 5;18(26):6071-83. doi: 10.1088/0953-8984/18/26/025. Epub 2006 Jun 19. J Phys Condens Matter. 2006. PMID: 21690820

5

Direct investigation of (sub-) surface preparation artifacts in GaAs based materials by FIB sectioning.

Belz J, Beyer A, Torunski T, Stolz W, Volz K. Belz J, et al. Among authors: stolz w. Ultramicroscopy. 2016 Apr;163:19-30. doi: 10.1016/j.ultramic.2016.01.001. Epub 2016 Jan 27. Ultramicroscopy. 2016. PMID: 26855206

6

Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K: an alternative to nonlinear scanning near-field optical microscopy.

Vollmer M, Giessen H, Stolz W, Rühle WW, Knorr A, Koch SW, Ghislain L, Elings V. Vollmer M, et al. Among authors: stolz w. J Microsc. 1999 May-Jun;194(Pt 2-3):523-7. doi: 10.1046/j.1365-2818.1999.00508.x. J Microsc. 1999. PMID: 11388299

7

Quantitative characterization of the interface roughness of (GaIn)As quantum wells by high resolution STEM.

Han H, Beyer A, Jandieri K, Gries KI, Duschek L, Stolz W, Volz K. Han H, et al. Among authors: stolz w. Micron. 2015 Dec;79:1-7. doi: 10.1016/j.micron.2015.07.003. Epub 2015 Jul 26. Micron. 2015. PMID: 26280278

8

FIB Plan View Preparation and Electron Tomography of Ga-Containing Droplets Induced by Melt-Back Etching in Si.

Gries KI, Werner K, Beyer A, Stolz W, Volz K. Gries KI, et al. Among authors: stolz w. Microsc Microanal. 2016 Feb;22(1):131-9. doi: 10.1017/S1431927615015615. Epub 2016 Jan 7. Microsc Microanal. 2016. PMID: 26739750

9

Atomic structure of 'W'-type quantum well heterostructures investigated by aberration-corrected STEM.

Kükelhan P, Beyer A, Fuchs C, Weseloh MJ, Koch SW, Stolz W, Volz K. Kükelhan P, et al. Among authors: stolz w. J Microsc. 2017 Dec;268(3):259-268. doi: 10.1111/jmi.12647. Epub 2017 Sep 27. J Microsc. 2017. PMID: 28960298

10

An experimental approach for real time mass spectrometric CVD gas phase investigations.

Nattermann L, Maßmeyer O, Sterzer E, Derpmann V, Chung HY, Stolz W, Volz K. Nattermann L, et al. Among authors: stolz w. Sci Rep. 2018 Jan 10;8(1):319. doi: 10.1038/s41598-017-18662-7. Sci Rep. 2018. PMID: 29321588 Free PMC article.

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