Grieb T - Search Results

1

4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection.

Grieb T, Krause FF, Müller-Caspary K, Ritz R, Simson M, Schörmann J, Mahr C, Müßener J, Schowalter M, Soltau H, Eickhoff M, Rosenauer A. Grieb T, et al. Ultramicroscopy. 2021 Sep;228:113321. doi: 10.1016/j.ultramic.2021.113321. Epub 2021 Jun 17. Ultramicroscopy. 2021. PMID: 34175788

2

Determination of the chemical composition of GaNAs using STEM HAADF imaging and STEM strain state analysis.

Grieb T, Müller K, Fritz R, Schowalter M, Neugebohrn N, Knaub N, Volz K, Rosenauer A. Grieb T, et al. Ultramicroscopy. 2012 Jun;117:15-23. doi: 10.1016/j.ultramic.2012.03.014. Epub 2012 Apr 1. Ultramicroscopy. 2012. PMID: 22634136

3

Compositional characterization of GaAs/GaAsSb nanowires by quantitative HAADF-STEM.

Kauko H, Grieb T, Bjørge R, Schowalter M, Munshi AM, Weman H, Rosenauer A, van Helvoort AT. Kauko H, et al. Among authors: grieb t. Micron. 2013 Jan;44:254-60. doi: 10.1016/j.micron.2012.07.002. Epub 2012 Jul 20. Micron. 2013. PMID: 22854214

4

A critical study: assessment of the effect of silica particles from 15 to 500 nm on bacterial viability.

Wehling J, Volkmann E, Grieb T, Rosenauer A, Maas M, Treccani L, Rezwan K. Wehling J, et al. Among authors: grieb t. Environ Pollut. 2013 May;176:292-9. doi: 10.1016/j.envpol.2013.02.001. Epub 2013 Mar 1. Environ Pollut. 2013. PMID: 23455355

5

Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifacts.

Grieb T, Müller K, Fritz R, Grillo V, Schowalter M, Volz K, Rosenauer A. Grieb T, et al. Ultramicroscopy. 2013 Jun;129:1-9. doi: 10.1016/j.ultramic.2013.02.006. Epub 2013 Feb 16. Ultramicroscopy. 2013. PMID: 23542584

6

Coherently embedded Ag nanostructures in Si: 3D imaging and their application to SERS.

Juluri RR, Rath A, Ghosh A, Bhukta A, Sathyavathi R, Rao DN, Müller K, Schowalter M, Frank K, Grieb T, Krause F, Rosenauer A, Satyam PV. Juluri RR, et al. Among authors: grieb t. Sci Rep. 2014 Apr 10;4:4633. doi: 10.1038/srep04633. Sci Rep. 2014. PMID: 24717601 Free PMC article.

7

Simultaneous quantification of indium and nitrogen concentration in InGaNAs using HAADF-STEM.

Grieb T, Müller K, Cadel E, Beyer A, Schowalter M, Talbot E, Volz K, Rosenauer A. Grieb T, et al. Microsc Microanal. 2014 Dec;20(6):1740-52. doi: 10.1017/S1431927614013051. Epub 2014 Sep 30. Microsc Microanal. 2014. PMID: 25268110

8

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction.

Mahr C, Müller-Caspary K, Grieb T, Schowalter M, Mehrtens T, Krause FF, Zillmann D, Rosenauer A. Mahr C, et al. Among authors: grieb t. Ultramicroscopy. 2015 Nov;158:38-48. doi: 10.1016/j.ultramic.2015.06.011. Epub 2015 Jun 14. Ultramicroscopy. 2015. PMID: 26141289

9

Effects of instrument imperfections on quantitative scanning transmission electron microscopy.

Krause FF, Schowalter M, Grieb T, Müller-Caspary K, Mehrtens T, Rosenauer A. Krause FF, et al. Among authors: grieb t. Ultramicroscopy. 2016 Feb;161:146-160. doi: 10.1016/j.ultramic.2015.10.026. Epub 2015 Oct 30. Ultramicroscopy. 2016. PMID: 26686661

10

Measurement of atomic electric fields and charge densities from average momentum transfers using scanning transmission electron microscopy.

Müller-Caspary K, Krause FF, Grieb T, Löffler S, Schowalter M, Béché A, Galioit V, Marquardt D, Zweck J, Schattschneider P, Verbeeck J, Rosenauer A. Müller-Caspary K, et al. Among authors: grieb t. Ultramicroscopy. 2017 Jul;178:62-80. doi: 10.1016/j.ultramic.2016.05.004. Epub 2016 May 12. Ultramicroscopy. 2017. PMID: 27217350

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