A compact ion source combining electron-impact and thermal ionization for multiple-reflection time-of-flight mass spectrometry.
Yu J, Mollaebrahimi A, San Andrés SA, Dickel T, Plaß WR, Wilsenach H, Beck S, Ge Z, Geissel H, Hornung C, Jacobs A, Kripko-Koncz G, Kwiatkowski AA, Narang M, Scheidenberger C, Sequeira J, Walls C.
Yu J, et al. Among authors: sequeira j.
Rev Sci Instrum. 2024 Aug 1;95(8):083309. doi: 10.1063/5.0213443.
Rev Sci Instrum. 2024.
PMID: 39212500