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Characterisation of negative-Udefects in semiconductors.
Coutinho J, Markevich VP, Peaker AR. Coutinho J, et al. Among authors: peaker ar. J Phys Condens Matter. 2020 May 12;32(32). doi: 10.1088/1361-648X/ab8091. J Phys Condens Matter. 2020. PMID: 32182607 Review.
Entropy-driven metastabilities in defects in semiconductors.
Hamilton B, Peaker AR, Pantelides ST. Hamilton B, et al. Among authors: peaker ar. Phys Rev Lett. 1988 Oct 3;61(14):1627-1630. doi: 10.1103/PhysRevLett.61.1627. Phys Rev Lett. 1988. PMID: 10038854 No abstract available.