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Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization.
Mukherjee K, De Santi C, Borga M, Geens K, You S, Bakeroot B, Decoutere S, Diehle P, Hübner S, Altmann F, Buffolo M, Meneghesso G, Zanoni E, Meneghini M. Mukherjee K, et al. Among authors: meneghini m. Materials (Basel). 2021 Apr 29;14(9):2316. doi: 10.3390/ma14092316. Materials (Basel). 2021. PMID: 33946943 Free PMC article. Review.
Laser-Based Lighting: Experimental Analysis and Perspectives.
Trivellin N, Yushchenko M, Buffolo M, De Santi C, Meneghini M, Meneghesso G, Zanoni E. Trivellin N, et al. Among authors: meneghini m. Materials (Basel). 2017 Oct 11;10(10):1166. doi: 10.3390/ma10101166. Materials (Basel). 2017. PMID: 29019958 Free PMC article.
GaN-Based Laser Wireless Power Transfer System.
De Santi C, Meneghini M, Caria A, Dogmus E, Zegaoui M, Medjdoub F, Kalinic B, Cesca T, Meneghesso G, Zanoni E. De Santi C, et al. Among authors: meneghini m. Materials (Basel). 2018 Jan 17;11(1):153. doi: 10.3390/ma11010153. Materials (Basel). 2018. PMID: 29342114 Free PMC article.
Vertical Leakage in GaN-on-Si Stacks Investigated by a Buffer Decomposition Experiment.
Tajalli A, Borga M, Meneghini M, De Santi C, Benazzi D, Besendörfer S, Püsche R, Derluyn J, Degroote S, Germain M, Kabouche R, Abid I, Meissner E, Zanoni E, Medjdoub F, Meneghesso G. Tajalli A, et al. Among authors: meneghini m. Micromachines (Basel). 2020 Jan 17;11(1):101. doi: 10.3390/mi11010101. Micromachines (Basel). 2020. PMID: 31963553 Free PMC article.
92 results