Temperature stability of thin film refractory plasmonic materials.
Wells MP, Bower R, Kilmurray R, Zou B, Mihai AP, Gobalakrichenane G, Alford NM, Oulton RFM, Cohen LF, Maier SA, Zayats AV, Petrov PK.
Wells MP, et al. Among authors: bower r.
Opt Express. 2018 Jun 11;26(12):15726-15744. doi: 10.1364/OE.26.015726.
Opt Express. 2018.
PMID: 30114830
Free article.