Kirpal D - Search Results

Save citations to file

Email citations

Your saved search

Your RSS Feed

Page 1

Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions.

Pürckhauer K, Maier S, Merkel A, Kirpal D, Giessibl FJ. Pürckhauer K, et al. Among authors: kirpal d. Rev Sci Instrum. 2020 Aug 1;91(8):083701. doi: 10.1063/5.0013921. Rev Sci Instrum. 2020. PMID: 32872933

Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.

Kirpal D, Qiu J, Pürckhauer K, Weymouth AJ, Metz M, Giessibl FJ. Kirpal D, et al. Rev Sci Instrum. 2021 Apr 1;92(4):043703. doi: 10.1063/5.0041369. Rev Sci Instrum. 2021. PMID: 34243447

Ion mobility and material transport on KBr in air as a function of the relative humidity.

Kirpal DJ, Pürckhauer K, Weymouth AJ, Giessibl FJ. Kirpal DJ, et al. Beilstein J Nanotechnol. 2019 Oct 30;10:2084-2093. doi: 10.3762/bjnano.10.203. eCollection 2019. Beilstein J Nanotechnol. 2019. PMID: 31728256 Free PMC article.

Save citations to file

Email citations

Send citations to clipboard

Add to Collections

Add to My Bibliography

Create a file for external citation management software

Your saved search

Your RSS Feed

My Custom Filters

Publication date

Text availability

Article attribute

Article type

Article Language

Species

Sex

Age

Other

3 results

Search Page

Filters