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Ferroelectricity and antiferroelectricity of doped thin HfO2-based films.
Park MH, Lee YH, Kim HJ, Kim YJ, Moon T, Kim KD, Müller J, Kersch A, Schroeder U, Mikolajick T, Hwang CS. Park MH, et al. Among authors: kim yj, kim hj, kim kd. Adv Mater. 2015 Mar 18;27(11):1811-31. doi: 10.1002/adma.201404531. Epub 2015 Feb 11. Adv Mater. 2015. PMID: 25677113
Time-Dependent Negative Capacitance Effects in Al2O3/BaTiO3 Bilayers.
Kim YJ, Yamada H, Moon T, Kwon YJ, An CH, Kim HJ, Kim KD, Lee YH, Hyun SD, Park MH, Hwang CS. Kim YJ, et al. Among authors: kim hj, kim kd. Nano Lett. 2016 Jul 13;16(7):4375-81. doi: 10.1021/acs.nanolett.6b01480. Epub 2016 Jun 1. Nano Lett. 2016. PMID: 27231754
Effect of Zr Content on the Wake-Up Effect in Hf1-xZrxO2 Films.
Park MH, Kim HJ, Kim YJ, Lee YH, Moon T, Kim KD, Hyun SD, Fengler F, Schroeder U, Hwang CS. Park MH, et al. Among authors: kim yj, kim hj, kim kd. ACS Appl Mater Interfaces. 2016 Jun 22;8(24):15466-75. doi: 10.1021/acsami.6b03586. Epub 2016 Jun 9. ACS Appl Mater Interfaces. 2016. PMID: 27237137
Giant Negative Electrocaloric Effects of Hf0.5 Zr0.5 O2 Thin Films.
Park MH, Kim HJ, Kim YJ, Moon T, Kim KD, Lee YH, Hyun SD, Hwang CS. Park MH, et al. Among authors: kim yj, kim hj, kim kd. Adv Mater. 2016 Sep;28(36):7956-7961. doi: 10.1002/adma.201602787. Epub 2016 Jul 4. Adv Mater. 2016. PMID: 27376963
21,945 results
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