Van Aert S - Search Results

1

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy.

Martinez GT, van den Bos KHW, Alania M, Nellist PD, Van Aert S. Martinez GT, et al. Among authors: van den bos khw, van aert s. Ultramicroscopy. 2018 Apr;187:84-92. doi: 10.1016/j.ultramic.2018.01.005. Epub 2018 Jan 31. Ultramicroscopy. 2018. PMID: 29413416

2

Restructuring of titanium oxide overlayers over nickel nanoparticles during catalysis.

Monai M, Jenkinson K, Melcherts AEM, Louwen JN, Irmak EA, Van Aert S, Altantzis T, Vogt C, van der Stam W, Duchoň T, Šmíd B, Groeneveld E, Berben P, Bals S, Weckhuysen BM. Monai M, et al. Among authors: van der stam w, van aert s. Science. 2023 May 12;380(6645):644-651. doi: 10.1126/science.adf6984. Epub 2023 May 11. Science. 2023. PMID: 37167405

3

Is atomic resolution transmission electron microscopy able to resolve and refine amorphous structures?

Van Dyck D, Van Aert S, den Dekker AJ, van den Bos A. Van Dyck D, et al. Among authors: van den bos a, van aert s. Ultramicroscopy. 2003 Dec;98(1):27-42. doi: 10.1016/S0304-3991(03)00023-8. Ultramicroscopy. 2003. PMID: 14609640

4

Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.

Van Aert S, den Dekker AJ, van den Bos A, Van Dyck D, Chen JH. Van Aert S, et al. Among authors: van dyck d, van den bos a. Ultramicroscopy. 2005 Sep;104(2):107-25. doi: 10.1016/j.ultramic.2005.03.002. Epub 2005 Apr 7. Ultramicroscopy. 2005. PMID: 15982521

5

An efficient way of including thermal diffuse scattering in simulation of scanning transmission electron microscopic images.

Croitoru MD, Van Dyck D, Van Aert S, Bals S, Verbeeck J. Croitoru MD, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2006 Aug-Sep;106(10):933-40. doi: 10.1016/j.ultramic.2006.04.006. Epub 2006 May 9. Ultramicroscopy. 2006. PMID: 16737777

6

Model-based quantification of EELS spectra: Including the fine structure.

Verbeeck J, Van Aert S, Bertoni G. Verbeeck J, et al. Among authors: van aert s. Ultramicroscopy. 2006 Oct-Nov;106(11-12):976-80. doi: 10.1016/j.ultramic.2006.05.006. Epub 2006 Jun 30. Ultramicroscopy. 2006. PMID: 16843599

7

Electron channelling based crystallography.

Van Aert S, Geuens P, Van Dyck D, Kisielowski C, Jinschek JR. Van Aert S, et al. Among authors: van dyck d. Ultramicroscopy. 2007 Jun-Jul;107(6-7):551-8. doi: 10.1016/j.ultramic.2006.04.031. Epub 2006 Dec 12. Ultramicroscopy. 2007. PMID: 17197092

8

Effect of amorphous layers on the interpretation of restored exit waves.

Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g. Ultramicroscopy. 2009 Feb;109(3):237-46. doi: 10.1016/j.ultramic.2008.10.024. Epub 2008 Nov 14. Ultramicroscopy. 2009. PMID: 19110376

9

Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.

Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, Van Dyck D, Van Tendeloo G. Van Aert S, et al. Among authors: van tendeloo g, van dyck d. Ultramicroscopy. 2009 Sep;109(10):1236-44. doi: 10.1016/j.ultramic.2009.05.010. Epub 2009 May 27. Ultramicroscopy. 2009. PMID: 19525069

10

A model based atomic resolution tomographic algorithm.

Van den Broek W, Van Aert S, Van Dyck D. Van den Broek W, et al. Among authors: van dyck d, van aert s. Ultramicroscopy. 2009 Nov;109(12):1485-90. doi: 10.1016/j.ultramic.2009.08.003. Epub 2009 Aug 27. Ultramicroscopy. 2009. PMID: 19765902

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