X-ray spectroscopy with variable line spacing based on reflection zone plate optics.
Yin Z, Löchel H, Rehanek J, Goy C, Kalinin A, Schottelius A, Trinter F, Miedema P, Jain A, Valerio J, Busse P, Lehmkühler F, Möller J, Grübel G, Madsen A, Viefhaus J, Grisenti RE, Beye M, Erko A, Techert S.
Yin Z, et al. Among authors: goy c.
Opt Lett. 2018 Sep 15;43(18):4390-4393. doi: 10.1364/OL.43.004390.
Opt Lett. 2018.
PMID: 30211872