MacLaren I - Search Results

1

Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards.

Craven AJ, Sala B, Bobynko J, MacLaren I. Craven AJ, et al. Among authors: maclaren i. Ultramicroscopy. 2018 Mar;186:66-81. doi: 10.1016/j.ultramic.2017.12.011. Epub 2017 Dec 13. Ultramicroscopy. 2018. PMID: 29274506 Free article.

2

Imaging and thickness measurement of amorphous intergranular films using TEM.

MacLaren I. MacLaren I. Ultramicroscopy. 2004 May;99(2-3):103-13. doi: 10.1016/j.ultramic.2003.10.002. Ultramicroscopy. 2004. PMID: 15093937

3

Spectrum imaging of complex nanostructures using DualEELS: I. Digital extraction replicas.

Bobynko J, MacLaren I, Craven AJ. Bobynko J, et al. Among authors: maclaren i. Ultramicroscopy. 2015 Feb;149:9-20. doi: 10.1016/j.ultramic.2014.10.014. Epub 2014 Nov 4. Ultramicroscopy. 2015. PMID: 25464155 Free article.

4

On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material.

MacLaren I, Wang L, McGrouther D, Craven AJ, McVitie S, Schierholz R, Kovács A, Barthel J, Dunin-Borkowski RE. MacLaren I, et al. Ultramicroscopy. 2015 Jul;154:57-63. doi: 10.1016/j.ultramic.2015.03.016. Epub 2015 Mar 19. Ultramicroscopy. 2015. PMID: 25837677 Free article.

5

Strain Localization in Thin Films of Bi(Fe,Mn)O3 Due to the Formation of Stepped Mn(4+)-Rich Antiphase Boundaries.

MacLaren I, Sala B, Andersson SM, Pennycook TJ, Xiong J, Jia QX, Choi EM, MacManus-Driscoll JL. MacLaren I, et al. Nanoscale Res Lett. 2015 Dec;10(1):407. doi: 10.1186/s11671-015-1116-8. Epub 2015 Oct 17. Nanoscale Res Lett. 2015. PMID: 26474888 Free PMC article.

6

Linear chemically sensitive electron tomography using DualEELS and dictionary-based compressed sensing.

AlAfeef A, Bobynko J, Cockshott WP, Craven AJ, Zuazo I, Barges P, MacLaren I. AlAfeef A, et al. Among authors: maclaren i. Ultramicroscopy. 2016 Nov;170:96-106. doi: 10.1016/j.ultramic.2016.08.004. Epub 2016 Aug 9. Ultramicroscopy. 2016. PMID: 27566049 Free article.

7

Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections.

Craven AJ, Bobynko J, Sala B, MacLaren I. Craven AJ, et al. Among authors: maclaren i. Ultramicroscopy. 2016 Nov;170:113-127. doi: 10.1016/j.ultramic.2016.08.012. Epub 2016 Aug 20. Ultramicroscopy. 2016. PMID: 27569850 Free article.

8

Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling.

Craven AJ, Sawada H, McFadzean S, MacLaren I. Craven AJ, et al. Among authors: maclaren i. Ultramicroscopy. 2017 Sep;180:66-80. doi: 10.1016/j.ultramic.2017.03.017. Epub 2017 Apr 1. Ultramicroscopy. 2017. PMID: 28377214 Free article.

9

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution.

Yang H, MacLaren I, Jones L, Martinez GT, Simson M, Huth M, Ryll H, Soltau H, Sagawa R, Kondo Y, Ophus C, Ercius P, Jin L, Kovács A, Nellist PD. Yang H, et al. Among authors: maclaren i. Ultramicroscopy. 2017 Sep;180:173-179. doi: 10.1016/j.ultramic.2017.02.006. Epub 2017 Apr 1. Ultramicroscopy. 2017. PMID: 28434783 Free article.

10

Characterisation of the Medipix3 detector for 60 and 80keV electrons.

Mir JA, Clough R, MacInnes R, Gough C, Plackett R, Shipsey I, Sawada H, MacLaren I, Ballabriga R, Maneuski D, O'Shea V, McGrouther D, Kirkland AI. Mir JA, et al. Among authors: maclaren i. Ultramicroscopy. 2017 Nov;182:44-53. doi: 10.1016/j.ultramic.2017.06.010. Epub 2017 Jun 20. Ultramicroscopy. 2017. PMID: 28654827 Free article.

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