Martinez GT - Search Results

1

Advanced electron crystallography through model-based imaging.

Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G. Van Aert S, et al. Among authors: martinez gt. IUCrJ. 2016 Jan 1;3(Pt 1):71-83. doi: 10.1107/S2052252515019727. eCollection 2016 Jan 1. IUCrJ. 2016. PMID: 26870383 Free PMC article. Review.

2

Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy.

van den Bos KH, De Backer A, Martinez GT, Winckelmans N, Bals S, Nellist PD, Van Aert S. van den Bos KH, et al. Among authors: martinez gt. Phys Rev Lett. 2016 Jun 17;116(24):246101. doi: 10.1103/PhysRevLett.116.246101. Epub 2016 Jun 17. Phys Rev Lett. 2016. PMID: 27367396

3

Control of Knock-On Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy.

Van Aert S, De Backer A, Jones L, Martinez GT, Béché A, Nellist PD. Van Aert S, et al. Among authors: martinez gt. Phys Rev Lett. 2019 Feb 15;122(6):066101. doi: 10.1103/PhysRevLett.122.066101. Phys Rev Lett. 2019. PMID: 30822049

4

Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations.

De Backer A, Martinez GT, Rosenauer A, Van Aert S. De Backer A, et al. Among authors: martinez gt. Ultramicroscopy. 2013 Nov;134:23-33. doi: 10.1016/j.ultramic.2013.05.003. Epub 2013 May 17. Ultramicroscopy. 2013. PMID: 23759467

5

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.

Martinez GT, Rosenauer A, De Backer A, Verbeeck J, Van Aert S. Martinez GT, et al. Ultramicroscopy. 2014 Feb;137:12-9. doi: 10.1016/j.ultramic.2013.11.001. Epub 2013 Nov 9. Ultramicroscopy. 2014. PMID: 24270003

6

The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images.

Martinez GT, De Backer A, Rosenauer A, Verbeeck J, Van Aert S. Martinez GT, et al. Micron. 2014 Aug;63:57-63. doi: 10.1016/j.micron.2013.12.009. Epub 2013 Dec 27. Micron. 2014. PMID: 24462219

7

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

De Backer A, Martinez GT, MacArthur KE, Jones L, Béché A, Nellist PD, Van Aert S. De Backer A, et al. Among authors: martinez gt. Ultramicroscopy. 2015 Apr;151:56-61. doi: 10.1016/j.ultramic.2014.11.028. Epub 2014 Dec 3. Ultramicroscopy. 2015. PMID: 25511931

8

Quantitative STEM normalisation: The importance of the electron flux.

Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098

9

Atomic resolution mapping of phonon excitations in STEM-EELS experiments.

Egoavil R, Gauquelin N, Martinez GT, Van Aert S, Van Tendeloo G, Verbeeck J. Egoavil R, et al. Among authors: martinez gt. Ultramicroscopy. 2014 Dec;147:1-7. doi: 10.1016/j.ultramic.2014.04.011. Epub 2014 May 29. Ultramicroscopy. 2014. PMID: 24949597

10

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy.

Martinez GT, van den Bos KHW, Alania M, Nellist PD, Van Aert S. Martinez GT, et al. Ultramicroscopy. 2018 Apr;187:84-92. doi: 10.1016/j.ultramic.2018.01.005. Epub 2018 Jan 31. Ultramicroscopy. 2018. PMID: 29413416

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