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Page 1
Quantitative STEM normalisation: The importance of the electron flux.
Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Among authors: verbeeck j. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098
Model based quantification of EELS spectra.
Verbeeck J, Van Aert S. Verbeeck J, et al. Ultramicroscopy. 2004 Nov;101(2-4):207-24. doi: 10.1016/j.ultramic.2004.06.004. Ultramicroscopy. 2004. PMID: 15450666
Experiments on inelastic electron holography.
Potapov PL, Lichte H, Verbeeck J, van Dyck D. Potapov PL, et al. Among authors: verbeeck j. Ultramicroscopy. 2006 Oct-Nov;106(11-12):1012-8. doi: 10.1016/j.ultramic.2006.05.012. Epub 2006 Jul 5. Ultramicroscopy. 2006. PMID: 16934930
Accuracy and precision in model based EELS quantification.
Bertoni G, Verbeeck J. Bertoni G, et al. Among authors: verbeeck j. Ultramicroscopy. 2008 Jul;108(8):782-90. doi: 10.1016/j.ultramic.2008.01.004. Epub 2008 Feb 5. Ultramicroscopy. 2008. PMID: 18329173
Optimal aperture sizes and positions for EMCD experiments.
Verbeeck J, Hébert C, Rubino S, Novák P, Rusz J, Houdellier F, Gatel C, Schattschneider P. Verbeeck J, et al. Ultramicroscopy. 2008 Aug;108(9):865-72. doi: 10.1016/j.ultramic.2008.02.007. Epub 2008 Mar 5. Ultramicroscopy. 2008. PMID: 18423875
Tomographic spectroscopic imaging; an experimental proof of concept.
Van den Broek W, Verbeeck J, Schryvers D, De Backer S, Scheunders P. Van den Broek W, et al. Among authors: verbeeck j. Ultramicroscopy. 2009 Mar;109(4):296-303. doi: 10.1016/j.ultramic.2008.11.022. Epub 2008 Dec 9. Ultramicroscopy. 2009. PMID: 19150751
247 results