Nellist PD - Search Results

1

Quantitative STEM normalisation: The importance of the electron flux.

Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Among authors: nellist pd. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098

2

Cryogenic electron ptychographic single particle analysis with wide bandwidth information transfer.

Pei X, Zhou L, Huang C, Boyce M, Kim JS, Liberti E, Hu Y, Sasaki T, Nellist PD, Zhang P, Stuart DI, Kirkland AI, Wang P. Pei X, et al. Among authors: nellist pd. Nat Commun. 2023 May 25;14(1):3027. doi: 10.1038/s41467-023-38268-0. Nat Commun. 2023. PMID: 37230988 Free PMC article.

3

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.

Cosgriff EC, D'Alfonso AJ, Allen LJ, Findlay SD, Kirkland AI, Nellist PD. Cosgriff EC, et al. Among authors: nellist pd. Ultramicroscopy. 2008 Nov;108(12):1558-66. doi: 10.1016/j.ultramic.2008.05.009. Epub 2008 Jun 1. Ultramicroscopy. 2008. PMID: 18639381

4

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.

Wang P, Behan G, Kirkland AI, Nellist PD, Cosgriff EC, D'Alfonso AJ, Morgan AJ, Allen LJ, Hashimoto A, Takeguchi M, Mitsuishi K, Shimojo M. Wang P, et al. Among authors: nellist pd. Ultramicroscopy. 2011 Jun;111(7):877-86. doi: 10.1016/j.ultramic.2010.10.012. Epub 2010 Oct 27. Ultramicroscopy. 2011. PMID: 21093152

5

Identifying and correcting scan noise and drift in the scanning transmission electron microscope.

Jones L, Nellist PD. Jones L, et al. Among authors: nellist pd. Microsc Microanal. 2013 Aug;19(4):1050-60. doi: 10.1017/S1431927613001402. Epub 2013 May 14. Microsc Microanal. 2013. PMID: 23673234

6

Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.

E H, Macarthur KE, Pennycook TJ, Okunishi E, D'Alfonso AJ, Lugg NR, Allen LJ, Nellist PD. E H, et al. Among authors: nellist pd. Ultramicroscopy. 2013 Oct;133:109-19. doi: 10.1016/j.ultramic.2013.07.002. Epub 2013 Jul 15. Ultramicroscopy. 2013. PMID: 23969066

7

Testing the accuracy of the two-dimensional object model in HAADF STEM.

Jones L, Nellist PD. Jones L, et al. Among authors: nellist pd. Micron. 2014 Aug;63:47-51. doi: 10.1016/j.micron.2013.12.012. Epub 2014 Jan 11. Micron. 2014. PMID: 24467815

8

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.

Jones L, Nellist PD. Jones L, et al. Among authors: nellist pd. J Microsc. 2014 May;254(2):47-64. doi: 10.1111/jmi.12117. Epub 2014 Mar 11. J Microsc. 2014. PMID: 24617853

9

The development of a 200 kV monochromated field emission electron source.

Mukai M, Kim JS, Omoto K, Sawada H, Kimura A, Ikeda A, Zhou J, Kaneyama T, Young NP, Warner JH, Nellist PD, Kirkland AI. Mukai M, et al. Among authors: nellist pd. Ultramicroscopy. 2014 May;140:37-43. doi: 10.1016/j.ultramic.2014.02.004. Epub 2014 Mar 12. Ultramicroscopy. 2014. PMID: 24657419

10

WS₂ 2D nanosheets in 3D nanoflowers.

Prabakaran A, Dillon F, Melbourne J, Jones L, Nicholls RJ, Holdway P, Britton J, Koos AA, Crossley A, Nellist PD, Grobert N. Prabakaran A, et al. Among authors: nellist pd. Chem Commun (Camb). 2014 Oct 21;50(82):12360-2. doi: 10.1039/c4cc04218b. Chem Commun (Camb). 2014. PMID: 25187313

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