De Backer A - Search Results

1

Quantitative STEM normalisation: The importance of the electron flux.

Martinez GT, Jones L, De Backer A, Béché A, Verbeeck J, Van Aert S, Nellist PD. Martinez GT, et al. Among authors: de backer a. Ultramicroscopy. 2015 Dec;159 Pt 1:46-58. doi: 10.1016/j.ultramic.2015.07.010. Epub 2015 Jul 31. Ultramicroscopy. 2015. PMID: 26318098

2

High precision measurements of atom column positions using model-based exit wave reconstruction.

De Backer A, Van Aert S, Van Dyck D. De Backer A, et al. Ultramicroscopy. 2011 Aug-Oct;111(9-10):1475-82. doi: 10.1016/j.ultramic.2011.07.002. Epub 2011 Jul 27. Ultramicroscopy. 2011. PMID: 21930019

3

Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations.

De Backer A, Martinez GT, Rosenauer A, Van Aert S. De Backer A, et al. Ultramicroscopy. 2013 Nov;134:23-33. doi: 10.1016/j.ultramic.2013.05.003. Epub 2013 May 17. Ultramicroscopy. 2013. PMID: 23759467

4

Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?

den Dekker AJ, Gonnissen J, De Backer A, Sijbers J, Van Aert S. den Dekker AJ, et al. Among authors: de backer a. Ultramicroscopy. 2013 Nov;134:34-43. doi: 10.1016/j.ultramic.2013.05.017. Epub 2013 Jun 1. Ultramicroscopy. 2013. PMID: 23820594

5

Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals.

Goris B, De Backer A, Van Aert S, Gómez-Graña S, Liz-Marzán LM, Van Tendeloo G, Bals S. Goris B, et al. Among authors: de backer a. Nano Lett. 2013 Sep 11;13(9):4236-41. doi: 10.1021/nl401945b. Epub 2013 Aug 20. Nano Lett. 2013. PMID: 23952010

6

Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.

Martinez GT, Rosenauer A, De Backer A, Verbeeck J, Van Aert S. Martinez GT, et al. Among authors: de backer a. Ultramicroscopy. 2014 Feb;137:12-9. doi: 10.1016/j.ultramic.2013.11.001. Epub 2013 Nov 9. Ultramicroscopy. 2014. PMID: 24270003

7

The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images.

Martinez GT, De Backer A, Rosenauer A, Verbeeck J, Van Aert S. Martinez GT, et al. Among authors: de backer a. Micron. 2014 Aug;63:57-63. doi: 10.1016/j.micron.2013.12.009. Epub 2013 Dec 27. Micron. 2014. PMID: 24462219

8

Optimal experimental design for nano-particle atom-counting from high-resolution STEM images.

De Backer A, De Wael A, Gonnissen J, Van Aert S. De Backer A, et al. Among authors: de wael a. Ultramicroscopy. 2015 Apr;151:46-55. doi: 10.1016/j.ultramic.2014.10.015. Epub 2014 Nov 11. Ultramicroscopy. 2015. PMID: 25499018

9

Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting.

De Backer A, Martinez GT, MacArthur KE, Jones L, Béché A, Nellist PD, Van Aert S. De Backer A, et al. Ultramicroscopy. 2015 Apr;151:56-61. doi: 10.1016/j.ultramic.2014.11.028. Epub 2014 Dec 3. Ultramicroscopy. 2015. PMID: 25511931

10

Measuring Lattice Strain in Three Dimensions through Electron Microscopy.

Goris B, De Beenhouwer J, De Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G. Goris B, et al. Among authors: de backer a, de beenhouwer j. Nano Lett. 2015 Oct 14;15(10):6996-7001. doi: 10.1021/acs.nanolett.5b03008. Epub 2015 Sep 9. Nano Lett. 2015. PMID: 26340328 Free PMC article.

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