Chkhalo NI - Search Results

1

Sub-micrometer resolution proximity X-ray microscope with digital image registration.

Chkhalo NI, Pestov AE, Salashchenko NN, Sherbakov AV, Skorokhodov EV, Svechnikov MV. Chkhalo NI, et al. Rev Sci Instrum. 2015 Jun;86(6):063701. doi: 10.1063/1.4921849. Rev Sci Instrum. 2015. PMID: 26133838

2

Short-period multilayer X-ray mirrors.

Andreev SS, Bibishkin MS, Chkhalo NI, Kluenkov EB, Prokhorov KA, Salashchenko NN, Zorina MV, Schafers F, Shmaenok LA. Andreev SS, et al. Among authors: chkhalo ni. J Synchrotron Radiat. 2003 Sep 1;10(Pt 5):358-60. doi: 10.1107/s0909049503015255. Epub 2003 Aug 28. J Synchrotron Radiat. 2003. PMID: 12944620

3

A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit aperture.

Chkhalo NI, Klimov AY, Rogov VV, Salashchenko NN, Toropov MN. Chkhalo NI, et al. Rev Sci Instrum. 2008 Mar;79(3):033107. doi: 10.1063/1.2900561. Rev Sci Instrum. 2008. PMID: 18376997

4

Roughness measurement and ion-beam polishing of super-smooth optical surfaces of fused quartz and optical ceramics.

Chkhalo NI, Churin SA, Pestov AE, Salashchenko NN, Vainer YA, Zorina MV. Chkhalo NI, et al. Opt Express. 2014 Aug 25;22(17):20094-106. doi: 10.1364/OE.22.020094. Opt Express. 2014. PMID: 25321219 Free article.

5

Note: A stand on the basis of atomic force microscope to study substrates for imaging optics.

Chkhalo NI, Salashchenko NN, Zorina MV. Chkhalo NI, et al. Rev Sci Instrum. 2015 Jan;86(1):016102. doi: 10.1063/1.4905336. Rev Sci Instrum. 2015. PMID: 25638129

6

Application of point diffraction interferometry for middle spatial frequency roughness detection.

Svechnikov MV, Chkhalo NI, Toropov MN, Salashchenko NN, Zorina MV. Svechnikov MV, et al. Among authors: chkhalo ni. Opt Lett. 2015 Jan 15;40(2):159-62. doi: 10.1364/OL.40.000159. Opt Lett. 2015. PMID: 25679833

7

Resolving capacity of the circular Zernike polynomials.

Svechnikov MV, Chkhalo NI, Toropov MN, Salashchenko NN. Svechnikov MV, et al. Among authors: chkhalo ni. Opt Express. 2015 Jun 1;23(11):14677-94. doi: 10.1364/OE.23.014677. Opt Express. 2015. PMID: 26072827 Free article.

8

Application of point diffraction interferometry for measuring angular displacement to a sensitivity of 0.01 arcsec.

Gavrilin DA, Kuzin SV, Salashchenko NN, Svechnikov MV, Toropov MN, Chkhalo NI, Soloviev AA. Gavrilin DA, et al. Among authors: chkhalo ni. Appl Opt. 2015 Nov 1;54(31):9315-9. doi: 10.1364/AO.54.009315. Appl Opt. 2015. PMID: 26560587

9

Problems in the application of a null lens for precise measurements of aspheric mirrors.

Chkhalo NI, Malyshev IV, Pestov AE, Polkovnikov VN, Salashchenko NN, Toropov MN, Soloviev AA. Chkhalo NI, et al. Appl Opt. 2016 Jan 20;55(3):619-25. doi: 10.1364/AO.55.000619. Appl Opt. 2016. PMID: 26835938

10

Ion-beam polishing of fused silica substrates for imaging soft x-ray and extreme ultraviolet optics.

Chkhalo NI, Churin SA, Mikhaylenko MS, Pestov AE, Polkovnikov VN, Salashchenko NN, Zorina MV. Chkhalo NI, et al. Appl Opt. 2016 Feb 20;55(6):1249-56. doi: 10.1364/AO.55.001249. Appl Opt. 2016. PMID: 26906575

Save citations to file

Email citations

Send citations to clipboard

Add to Collections

Add to My Bibliography

Create a file for external citation management software

Your saved search

Your RSS Feed

My Custom Filters

Publication date

Text availability

Article attribute

Article type

Article Language

Species

Sex

Age

Other

48 results

Search Page

Filters