Bai G - Search Results

1

Precisely mapping a major gene conferring resistance to Hessian fly in bread wheat using genotyping-by-sequencing.

Li G, Wang Y, Chen MS, Edae E, Poland J, Akhunov E, Chao S, Bai G, Carver BF, Yan L. Li G, et al. Among authors: bai g. BMC Genomics. 2015 Feb 21;16(1):108. doi: 10.1186/s12864-015-1297-7. BMC Genomics. 2015. PMID: 25765046 Free PMC article.

2

Management and resistance in wheat and barley to fusarium head blight.

Bai G, Shaner G. Bai G, et al. Annu Rev Phytopathol. 2004;42:135-61. doi: 10.1146/annurev.phyto.42.040803.140340. Annu Rev Phytopathol. 2004. PMID: 15283663 Review.

3

Novel quantitative trait loci (QTL) for Fusarium head blight resistance in wheat cultivar Chokwang.

Yang J, Bai G, Shaner GE. Yang J, et al. Among authors: bai g. Theor Appl Genet. 2005 Nov;111(8):1571-9. doi: 10.1007/s00122-005-0087-z. Epub 2005 Nov 10. Theor Appl Genet. 2005. PMID: 16172894

4

Marker-assisted characterization of Asian wheat lines for resistance to Fusarium head blight.

Yu JB, Bai GH, Cai SB, Ban T. Yu JB, et al. Theor Appl Genet. 2006 Jul;113(2):308-20. doi: 10.1007/s00122-006-0297-z. Epub 2006 May 23. Theor Appl Genet. 2006. PMID: 16791697

5

Transcriptional analysis between two wheat near-isogenic lines contrasting in aluminum tolerance under aluminum stress.

Guo P, Bai G, Carver B, Li R, Bernardo A, Baum M. Guo P, et al. Among authors: bai g. Mol Genet Genomics. 2007 Jan;277(1):1-12. doi: 10.1007/s00438-006-0169-x. Epub 2006 Oct 13. Mol Genet Genomics. 2007. PMID: 17039377

6

Quantitative trait loci for aluminum resistance in Chinese wheat landrace FSW.

Cai S, Bai GH, Zhang D. Cai S, et al. Theor Appl Genet. 2008 Jun;117(1):49-56. doi: 10.1007/s00122-008-0751-1. Epub 2008 Apr 1. Theor Appl Genet. 2008. PMID: 18379752

7

Quantitative trait loci for resistance to pre-harvest sprouting in US hard white winter wheat Rio Blanco.

Liu S, Cai S, Graybosch R, Chen C, Bai G. Liu S, et al. Among authors: bai g. Theor Appl Genet. 2008 Sep;117(5):691-9. doi: 10.1007/s00122-008-0810-7. Epub 2008 Jun 10. Theor Appl Genet. 2008. PMID: 18542909

8

Diverse origins of aluminum-resistance sources in wheat.

Hu SW, Bai GH, Carver BF, Zhang DD. Hu SW, et al. Theor Appl Genet. 2008 Dec;118(1):29-41. doi: 10.1007/s00122-008-0874-4. Epub 2008 Sep 12. Theor Appl Genet. 2008. PMID: 18787805

9

Lesion mimic associates with adult plant resistance to leaf rust infection in wheat.

Li T, Bai G. Li T, et al. Among authors: bai g. Theor Appl Genet. 2009 Jun;119(1):13-21. doi: 10.1007/s00122-009-1012-7. Epub 2009 Mar 28. Theor Appl Genet. 2009. PMID: 19330313

10

The major threshability genes soft glume (sog) and tenacious glume (Tg), of diploid and polyploid wheat, trace their origin to independent mutations at non-orthologous loci.

Sood S, Kuraparthy V, Bai G, Gill BS. Sood S, et al. Among authors: bai g. Theor Appl Genet. 2009 Jul;119(2):341-51. doi: 10.1007/s00122-009-1043-0. Epub 2009 May 7. Theor Appl Genet. 2009. PMID: 19421730

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