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Full tip imaging in atom probe tomography.
Du S, Burgess T, Loi ST, Gault B, Gao Q, Bao P, Li L, Cui X, Kong Yeoh W, Tan HH, Jagadish C, Ringer SP, Zheng R. Du S, et al. Among authors: cui x. Ultramicroscopy. 2013 Jan;124:96-101. doi: 10.1016/j.ultramic.2012.08.014. Epub 2012 Sep 6. Ultramicroscopy. 2013. PMID: 23142750
Quantitative dopant distributions in GaAs nanowires using atom probe tomography.
Du S, Burgess T, Gault B, Gao Q, Bao P, Li L, Cui X, Kong Yeoh W, Liu H, Yao L, Ceguerra AV, Hoe Tan H, Jagadish C, Ringer SP, Zheng R. Du S, et al. Among authors: cui x. Ultramicroscopy. 2013 Sep;132:186-92. doi: 10.1016/j.ultramic.2013.02.012. Epub 2013 Feb 16. Ultramicroscopy. 2013. PMID: 23489910
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