Depth-of-Discharge Dependent Capacity Decay Induced by the Accumulation of Oxidized Lattice Oxygen in Li-Rich Layered Oxide Cathode.
Zhang K, Chen Y, Zhu Y, Zheng Q, Tang Y, Yu D, Liu Q, Luo H, Yin J, Zeng L, Jiao W, Liu N, Wang Q, Zheng L, Zhang J, Wang Y, Zhang B, Yan Y, Huang H, Shen CH, Qiao Y, Sun SG.
Zhang K, et al. Among authors: shen ch.
Angew Chem Int Ed Engl. 2024 Nov 28:e202419909. doi: 10.1002/anie.202419909. Online ahead of print.
Angew Chem Int Ed Engl. 2024.
PMID: 39606829