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Ballistic-electron-emission microscopy of strained Si1-xGex layers.
Bell LD, Milliken AM, Manion SJ, Kaiser WJ, Fathauer RW, Pike WT. Bell LD, et al. Among authors: fathauer rw. Phys Rev B Condens Matter. 1994 Sep 15;50(11):8082-8085. doi: 10.1103/physrevb.50.8082. Phys Rev B Condens Matter. 1994. PMID: 9974816 No abstract available.
Ballistic-carrier spectroscopy of the CoSi2/Si interface.
Kaiser WJ, Hecht MH, Fathauer RW, Bell LD, Lee EY, Davis LC. Kaiser WJ, et al. Among authors: fathauer rw. Phys Rev B Condens Matter. 1991 Sep 15;44(12):6546-6549. doi: 10.1103/physrevb.44.6546. Phys Rev B Condens Matter. 1991. PMID: 9998525 No abstract available.