A general approach to obtain soft x-ray transparency for thin films grown on bulk substrates.
Fohler M, Frömmel S, Schneider M, Pfau B, Günther CM, Hennecke M, Guehrs E, Shemilt L, Mishra D, Berger D, Selve S, Mitin D, Albrecht M, Eisebitt S.
Fohler M, et al. Among authors: selve s.
Rev Sci Instrum. 2017 Oct;88(10):103701. doi: 10.1063/1.5006522.
Rev Sci Instrum. 2017.
PMID: 29092481