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Sample preparation by focused ion beam micromachining for transmission electron microscopy imaging in front-view.
Micron. 2014 Jan;56:63-7. doi: 10.1016/j.micron.2013.10.007. Epub 2013 Oct 19.
Micron. 2014.
PMID: 24200984
HRTEM and EELS study of Y2O3/MgO thin films.
Pailloux F, Imhoff D, Jublot M, Paumier F, Gaboriaud RJ, Jaouen M.
Pailloux F, et al. Among authors: jublot m.
Micron. 2006;37(5):420-5. doi: 10.1016/j.micron.2005.12.008. Epub 2006 Jan 19.
Micron. 2006.
PMID: 16466928
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Molecular insights of oxidation process of iron nanoparticles: spectroscopic, magnetic, and microscopic evidence.
Kumar N, Auffan M, Gattacceca J, Rose J, Olivi L, Borschneck D, Kvapil P, Jublot M, Kaifas D, Malleret L, Doumenq P, Bottero JY.
Kumar N, et al. Among authors: jublot m.
Environ Sci Technol. 2014 Dec 2;48(23):13888-94. doi: 10.1021/es503154q. Epub 2014 Nov 17.
Environ Sci Technol. 2014.
PMID: 25369322
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Catalyst preparation for CMOS-compatible silicon nanowire synthesis.
Renard VT, Jublot M, Gergaud P, Cherns P, Rouchon D, Chabli A, Jousseaume V.
Renard VT, et al. Among authors: jublot m.
Nat Nanotechnol. 2009 Oct;4(10):654-7. doi: 10.1038/nnano.2009.234. Epub 2009 Aug 23.
Nat Nanotechnol. 2009.
PMID: 19809456
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