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Exploring aberration-corrected electron microscopy for compound semiconductors.
Microscopy (Oxf). 2013 Jun;62 Suppl 1:S65-73. doi: 10.1093/jmicro/dft011. Epub 2013 Mar 27.
Microscopy (Oxf). 2013.
PMID: 23536701
Irradiation-induced grain growth and defect evolution in nanocrystalline zirconia with doped grain boundaries.
Dey S, Mardinly J, Wang Y, Valdez JA, Holesinger TG, Uberuaga BP, Ditto JJ, Drazin JW, Castro RH.
Dey S, et al. Among authors: mardinly j.
Phys Chem Chem Phys. 2016 Jun 22;18(25):16921-9. doi: 10.1039/c6cp01763k.
Phys Chem Chem Phys. 2016.
PMID: 27282392
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HRTEM image simulations for the study of ultrathin gate oxides.
Taylor ST, Mardinly J, O'Keefe MA.
Taylor ST, et al. Among authors: mardinly j.
Microsc Microanal. 2002 Oct;8(5):412-21. doi: 10.1017/S1431927602020123.
Microsc Microanal. 2002.
PMID: 12533217
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