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Page 1
Domain dynamics during ferroelectric switching.
Nelson CT, Gao P, Jokisaari JR, Heikes C, Adamo C, Melville A, Baek SH, Folkman CM, Winchester B, Gu Y, Liu Y, Zhang K, Wang E, Li J, Chen LQ, Eom CB, Schlom DG, Pan X. Nelson CT, et al. Science. 2011 Nov 18;334(6058):968-71. doi: 10.1126/science.1206980. Science. 2011. PMID: 22096196
Direct observations of retention failure in ferroelectric memories.
Gao P, Nelson CT, Jokisaari JR, Zhang Y, Baek SH, Bark CW, Wang E, Liu Y, Li J, Eom CB, Pan X. Gao P, et al. Among authors: nelson ct. Adv Mater. 2012 Feb 21;24(8):1106-10. doi: 10.1002/adma.201103983. Adv Mater. 2012. PMID: 22331626 Free article.
Metallic and insulating oxide interfaces controlled by electronic correlations.
Jang HW, Felker DA, Bark CW, Wang Y, Niranjan MK, Nelson CT, Zhang Y, Su D, Folkman CM, Baek SH, Lee S, Janicka K, Zhu Y, Pan XQ, Fong DD, Tsymbal EY, Rzchowski MS, Eom CB. Jang HW, et al. Among authors: nelson ct. Science. 2011 Feb 18;331(6019):886-9. doi: 10.1126/science.1198781. Science. 2011. PMID: 21330538
Ferroelectricity in strain-free SrTiO3 thin films.
Jang HW, Kumar A, Denev S, Biegalski MD, Maksymovych P, Bark CW, Nelson CT, Folkman CM, Baek SH, Balke N, Brooks CM, Tenne DA, Schlom DG, Chen LQ, Pan XQ, Kalinin SV, Gopalan V, Eom CB. Jang HW, et al. Among authors: nelson ct. Phys Rev Lett. 2010 May 14;104(19):197601. doi: 10.1103/PhysRevLett.104.197601. Epub 2010 May 13. Phys Rev Lett. 2010. PMID: 20866998
139 results