Kimoto K - Search Results

1

Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun.

Sasaki T, Sawada H, Hosokawa F, Kohno Y, Tomita T, Kaneyama T, Kondo Y, Kimoto K, Sato Y, Suenaga K. Sasaki T, et al. Among authors: kimoto k. J Electron Microsc (Tokyo). 2010 Aug;59 Suppl 1:S7-13. doi: 10.1093/jmicro/dfq027. Epub 2010 Jun 27. J Electron Microsc (Tokyo). 2010. PMID: 20581425

2

Quantitative evaluation of temporal partial coherence using 3D Fourier transforms of through-focus TEM images.

Kimoto K, Sawada H, Sasaki T, Sato Y, Nagai T, Ohwada M, Suenaga K, Ishizuka K. Kimoto K, et al. Ultramicroscopy. 2013 Nov;134:86-93. doi: 10.1016/j.ultramic.2013.06.008. Epub 2013 Jun 21. Ultramicroscopy. 2013. PMID: 23834771 Free article.

3

Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage.

Suenaga K, Sato Y, Liu Z, Kataura H, Okazaki T, Kimoto K, Sawada H, Sasaki T, Omoto K, Tomita T, Kaneyama T, Kondo Y. Suenaga K, et al. Among authors: kimoto k. Nat Chem. 2009 Aug;1(5):415-8. doi: 10.1038/nchem.282. Epub 2009 Jul 5. Nat Chem. 2009. PMID: 21378897

4

Exciton mapping at subwavelength scales in two-dimensional materials.

Tizei LH, Lin YC, Mukai M, Sawada H, Lu AY, Li LJ, Kimoto K, Suenaga K. Tizei LH, et al. Among authors: kimoto k. Phys Rev Lett. 2015 Mar 13;114(10):107601. doi: 10.1103/PhysRevLett.114.107601. Epub 2015 Mar 13. Phys Rev Lett. 2015. PMID: 25815966

5

TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba2FeMoO6.

Yu X, Asaka T, Tomioka Y, Tsuruta C, Nagai T, Kimoto K, Kaneko Y, Tokura Y, Matsui Y. Yu X, et al. Among authors: kimoto k. J Electron Microsc (Tokyo). 2005 Jan;54(1):61-5. doi: 10.1093/jmicro/dfh104. J Electron Microsc (Tokyo). 2005. PMID: 15695487

6

Development of dedicated STEM with high stability.

Kimoto K, Nakamura K, Aizawa S, Isakozawa S, Matsui Y. Kimoto K, et al. J Electron Microsc (Tokyo). 2007 Jan;56(1):17-20. doi: 10.1093/jmicro/dfl043. Epub 2007 Feb 2. J Electron Microsc (Tokyo). 2007. PMID: 17277005

7

Effect of specimen misalignment on local structure analysis using annular dark-field imaging.

So YG, Kimoto K. So YG, et al. Among authors: kimoto k. J Electron Microsc (Tokyo). 2012 Aug;61(4):207-15. doi: 10.1093/jmicro/dfs045. Epub 2012 May 4. J Electron Microsc (Tokyo). 2012. PMID: 22561921

8

Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique.

Kimoto K, Matsui Y. Kimoto K, et al. J Electron Microsc (Tokyo). 2001;50(5):377-82. doi: 10.1093/jmicro/50.5.377. J Electron Microsc (Tokyo). 2001. PMID: 11794612

9

Spatially-resolved EELS analysis of multilayer using EFTEM and STEM.

Kimoto K, Isakozawa S, Aoyama T, Matsui Y. Kimoto K, et al. J Electron Microsc (Tokyo). 2001;50(6):523-8. doi: 10.1093/jmicro/50.6.523. J Electron Microsc (Tokyo). 2001. PMID: 11918419

10

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy.

Saito M, Kimoto K, Nagai T, Fukushima S, Akahoshi D, Kuwahara H, Matsui Y, Ishizuka K. Saito M, et al. Among authors: kimoto k. J Electron Microsc (Tokyo). 2009 Jun;58(3):131-6. doi: 10.1093/jmicro/dfn023. Epub 2008 Nov 25. J Electron Microsc (Tokyo). 2009. PMID: 19033323

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