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Extreme-ultraviolet-induced oxidation of Mo/Si multilayers.
Benoit N, Schröder S, Yulin S, Feigl T, Duparré A, Kaiser N, Tünnermann A. Benoit N, et al. Among authors: tunnermann a. Appl Opt. 2008 Jul 1;47(19):3455-62. doi: 10.1364/ao.47.003455. Appl Opt. 2008. PMID: 18594592
Thin compound-eye camera.
Duparré J, Dannberg P, Schreiber P, Bräuer A, Tünnermann A. Duparré J, et al. Among authors: tunnermann a. Appl Opt. 2005 May 20;44(15):2949-56. doi: 10.1364/ao.44.002949. Appl Opt. 2005. PMID: 15929282
Optical and structural properties of LaF3 thin films.
Bischoff M, Gäbler D, Kaiser N, Chuvilin A, Kaiser U, Tünnermann A. Bischoff M, et al. Among authors: tunnermann a. Appl Opt. 2008 May 1;47(13):C157-61. doi: 10.1364/ao.47.00c157. Appl Opt. 2008. PMID: 18449239
Ultra low-loss low-efficiency diffraction gratings.
Clausnitzer T, Kley EB, Tünnermann A, Bunkowski A, Burmeister O, Danzmann K, Schnabel R, Gliech S, Duparré A. Clausnitzer T, et al. Among authors: tunnermann a. Opt Express. 2005 Jun 13;13(12):4370-8. doi: 10.1364/opex.13.004370. Opt Express. 2005. PMID: 19495352 Free article.
Bulk scattering properties of synthetic fused silica at 193 nm.
Schröder S, Kamprath M, Duparré A, Tünnermann A, Kühn B, Klett U. Schröder S, et al. Among authors: tunnermann a. Opt Express. 2006 Oct 30;14(22):10537-49. doi: 10.1364/oe.14.010537. Opt Express. 2006. PMID: 19529455 Free article.
472 results