Assessment of Mixed-Layer Height Estimation from Single-wavelength Ceilometer Profiles.
Knepp TN, Szykman JJ, Long R, Duvall RM, Krug J, Beaver M, Cavender K, Kronmiller K, Wheeler M, Delgado R, Hoff R, Berkoff T, Olson E, Clark R, Wolfe D, Van Gilst D, Neil D.
Knepp TN, et al. Among authors: cavender k.
Atmos Meas Tech. 2017;10:3963-3983. doi: 10.5194/amt-10-3963-2017.
Atmos Meas Tech. 2017.
PMID: 29682087
Free PMC article.