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Cancer incidence among semiconductor and electronic storage device workers.
Bender TJ, Beall C, Cheng H, Herrick RF, Kahn AR, Matthews R, Sathiakumar N, Schymura MJ, Stewart JH, Delzell E. Bender TJ, et al. Among authors: delzell e. Occup Environ Med. 2007 Jan;64(1):30-6. doi: 10.1136/oem.2005.023366. Epub 2006 Jul 17. Occup Environ Med. 2007. PMID: 16847035 Free PMC article.
Mortality among semiconductor and storage device-manufacturing workers.
Beall C, Bender TJ, Cheng H, Herrick R, Kahn A, Matthews R, Sathiakumar N, Schymura M, Stewart J, Delzell E. Beall C, et al. Among authors: delzell e. J Occup Environ Med. 2005 Oct;47(10):996-1014. doi: 10.1097/01.jom.0000183094.42763.f0. J Occup Environ Med. 2005. PMID: 16217241
TCDD exposure-response analysis and risk assessment.
Cheng H, Aylward L, Beall C, Starr TB, Brunet RC, Carrier G, Delzell E. Cheng H, et al. Among authors: delzell e. Risk Anal. 2006 Aug;26(4):1059-71. doi: 10.1111/j.1539-6924.2006.00800.x. Risk Anal. 2006. PMID: 16948697
210 results