Ballistic-electron-emission microscopy of strain nonuniformities in Si1-xGex/Si structures
Phys Rev B Condens Matter
.
1995 Oct 15;52(16):12081-12089.
doi: 10.1103/physrevb.52.12081.
Authors
LD Bell
,
WJ Kaiser
,
SJ Manion
,
AM Milliken
,
RW Fathauer
,
WT Pike
PMID:
9980349
DOI:
10.1103/physrevb.52.12081
No abstract available