Random Illumination Microscopy: faster, thicker, and aberration-insensitive

Boya Jin; Peng Xi

doi:10.1038/s41377-024-01687-9

Random Illumination Microscopy: faster, thicker, and aberration-insensitive

Light Sci Appl. 2025 Jan 2;14(1):19. doi: 10.1038/s41377-024-01687-9.

Authors

Boya Jin^{1

2}, Peng Xi^{3

4}

Affiliations

¹ Department of Biomedical Engineering, College of Future Technology, Peking University, Beijing, 100871, China.
² National Biomedical Imaging Center, Peking University, Beijing, 100871, China.
³ Department of Biomedical Engineering, College of Future Technology, Peking University, Beijing, 100871, China. xipeng@pku.edu.cn.
⁴ National Biomedical Imaging Center, Peking University, Beijing, 100871, China. xipeng@pku.edu.cn.

Abstract

The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.

Publication types

News