Application of sandpaper spray ionization mass spectrometry to comprehensively examine maple leaves infected with distinct fungi

Abstract

This study describes a novel application for sandpaper spray ionization mass spectrometry (SPS-MS), to examine the surface of maple tree (Acer sp.) leaves. By comparing mass spectrometry fingerprints, healthy leaves from those infected with powdery mildew and Rhytisma acerinum were distinguished. Leaves were grated with sandpaper, cut into triangles, and placed before the mass spectrometer, with the addition of a methanol-formic acid solution. Multivariate statistical analysis categorized the samples into three groups. Overall, SPS-MS effectively analyzed leaves with infectious microorganisms, potentially aiding in the creation of fungal identification databanks.

Keywords: ambient ionization; hierarchical cluster analysis (HCA); natural products; principal component analysis (PCA); sand paper spray (SPS).