We utilized computational analysis to investigate the impact of skull defects and skull implants on the TMS-induced EF. Our findings revealed a noteworthy alteration in the induced EF when acute skull defects were present. When high-conductivity titanium plates were used, we observed a pronounced increase in the peak EF, accompanied by a shift in the induced EF from the center towards both ends of the implant. These findings underscore the importance of carefully considering skull defects and implant materials during TMS.
Keywords: Computational model; Cranial defects; Skull plates; Transcranial magnetic stimulation.
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