The Kβ/Kα X-ray intensity ratios of Cu and Ag in Cu-Ag thin alloy films

Ömer Söğüt; Erhan Cengiz; Durdu Hayrettin Ayaz; Gökhan Apaydin

doi:10.1016/j.apradiso.2023.110957

The Kβ/Kα X-ray intensity ratios of Cu and Ag in Cu-Ag thin alloy films

Appl Radiat Isot. 2023 Oct:200:110957. doi: 10.1016/j.apradiso.2023.110957. Epub 2023 Jul 22.

Authors

Ömer Söğüt¹, Erhan Cengiz², Durdu Hayrettin Ayaz¹, Gökhan Apaydin³

Affiliations

¹ Kahramanmaraş Sütçü İmam University, Faculty of Art and Science, Department of Physics Kahramanmaraş, 46100, Turkey.
² Alanya Alaaddin Keykubat University, Rafet Kayış Engineering Faculty, Department of Fundamental Sciences, 07425, Alanya, Antalya, Turkey. Electronic address: erhan.cengiz@alanya.edu.tr.
³ Karadeniz Technical University, Faculty of Science, Department of Physics, 61080, Trabzon, Turkey.

PMID: 37494852
DOI: 10.1016/j.apradiso.2023.110957

Abstract

Kβ/Kα X-ray intensity ratio values of Cu and Ag in Cu_xAg_1-x (x = 53.5, 67.6, 76.9, 85.4, 89.6) thin alloy films produced from two different sources by the physical vapour deposition method have been determined by the Energy Dispersive X-ray Fluorescence Spectroscopy (EDXRF) method. The changes in the crystal structures of Cu_xAg_1-x thin alloy films caused by the changes in the Cu and Ag concentrations, which affect the valence electronic structure have been investigated by the X-ray Diffraction (XRD) techniques. The obtained values were compared with the theoretical and fitted values for pure Cu and Ag elements.

Keywords: (241)Am source; Cu–Ag thin alloy film; K X-ray intensity ratios; Valance electronic structure.