Correction: Influence of 4f filling on electronic and magnetic properties of rare earth-Au surface compounds

L Fernandez; M Blanco-Rey; R Castrillo-Bodero; M Ilyn; K Ali; E Turco; M Corso; M Ormaza; P Gargiani; M A Valbuena; A Mugarza; P Moras; P M Sheverdyaeva; Asish K Kundu; M Jugovac; C Laubschat; J E Ortega; F Schiller

doi:10.1039/d1nr90260a

Correction: Influence of 4f filling on electronic and magnetic properties of rare earth-Au surface compounds

Nanoscale. 2021 Dec 16;13(48):20704. doi: 10.1039/d1nr90260a.

Authors

L Fernandez^{1

2}, M Blanco-Rey^{3

4}, R Castrillo-Bodero^{4

2}, M Ilyn^{4

2}, K Ali^{4

2}, E Turco², M Corso^{4

2}, M Ormaza¹, P Gargiani⁵, M A Valbuena^{6

7}, A Mugarza^{6

8}, P Moras⁹, P M Sheverdyaeva⁹, Asish K Kundu⁹, M Jugovac⁹, C Laubschat¹⁰, J E Ortega^{1

2}, F Schiller^{4

2}

Affiliations

¹ Universidad del País Vasco UPV-EHU, Dpto. Física Aplicada I, 20018 San Sebastián, Spain.
² Centro de Física de Materiales CSIC/UPV-EHU-Materials Physics Center, 20018 San Sebastián, Spain.
³ Universidad del País Vasco UPV-EHU, Dpto. de Polímeros y Materiales Avanzados: Física, Química y Tecnología, 20018 San Sebastián, Spain.
⁴ Donostia International Physics Center, 20018 Donostia-San Sebastián, Spain. frederikmichael.schiller@ehu.es.
⁵ ALBA Synchrotron Light Source, Carretera BP 1413 km 3.3, 08290 Cerdanyola del Vallès, Spain.
⁶ Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and The Barcelona Institute of Science and Technology, Campus UAB, Bellaterra, 08193 Barcelona, Spain.
⁷ IMDEA Nanociencia, 28049 Madrid, Spain.
⁸ Institució Catalana de Recerca i Estudis Avançats (ICREA), 08070 Barcelona, Spain.
⁹ Istituto di Struttura della Materia, Consiglio Nazionale delle Ricerche, 34149 Trieste, Italy.
¹⁰ Institut für Festkörper- und Materialphysik, Technische Universität Dresden, 01062 Dresden, Germany.

PMID: 34874396
DOI: 10.1039/d1nr90260a

Abstract

Correction for 'Influence of 4f filling on electronic and magnetic properties of rare earth-Au surface compounds' by L. Fernandez et al., Nanoscale, 2020, 12, 22258-22267, DOI: 10.1039/D0NR04964F.

Publication types

Published Erratum