Corrigendum to "Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film" [Ultramicroscopy 189 (2018) 46-53]

Ultramicroscopy. 2020 Sep:216:112965. doi: 10.1016/j.ultramic.2020.112965. Epub 2020 May 12.

Authors

Roy Shiloh¹, Roei Remez², Peng-Han Lu³, Lei Jin³, Yossi Lereah², Amir H Tavabi³, Rafal E Dunin-Borkowski³, Ady Arie²

Affiliations

¹ School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel. Electronic address: royshilo@post.tau.ac.il.
² School of Electrical Engineering, Fleischman Faculty of Engineering, Tel Aviv University, Tel Aviv, Israel.
³ Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Forschungszentrum Jülich, Jülich, Germany.

PMID: 32414543
DOI: 10.1016/j.ultramic.2020.112965

No abstract available

Publication types

Published Erratum