Background: Parental depression represents a significant risk for depression development in offspring. While cognitive mechanisms represent a central risk pathway, children's appraisals of parental symptoms have been understudied. This study examined associations between children's self-blame, threat, and frequency/duration appraisals for maternal symptoms in relation to cognitive control and emotional response processes.
Methods: Sixty mother-daughter (aged 10-14-years) pairs participated. Affective processing was assessed by three Event Related Potential (ERP) components, the N2, P3, and LPP, during an emotional Go/NoGo task.
Results: Threat-appraisals were associated with alterations in all three ERP components, independently of maternal diagnostic histories or youth depressive symptoms. Self-blame was associated with early attentional engagement towards calm faces. Independent effects of maternal depression history and youth symptoms were also observed.
Conclusions: Results highlight the importance of youth perceptions of maternal depressive symptoms in models of depression-risk.
Keywords: Appraisals; EEG; Emotional Go/NoGo; Parental depression.
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