Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range
Anal Chem
.
1988 Jul 15;60(14):1426-8.
doi: 10.1021/ac00165a016.
Authors
W H Aberth
,
A L Burlingame
PMID:
3064656
DOI:
10.1021/ac00165a016
No abstract available
Publication types
Research Support, U.S. Gov't, P.H.S.
MeSH terms
Animals
Glucans / analysis
Humans
Insulin / analysis
Mass Spectrometry / instrumentation*
Substances
Glucans
Insulin
Grants and funding
GM32315/GM/NIGMS NIH HHS/United States