Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Michael W M Jones; Nicholas W Phillips; Grant A van Riessen; Brian Abbey; David J Vine; Youssef S G Nashed; Stephen T Mudie; Nader Afshar; Robin Kirkham; Bo Chen; Eugeniu Balaur; Martin D de Jonge

doi:10.1107/S1600577516011917

Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

J Synchrotron Radiat. 2016 Sep 1;23(Pt 5):1151-7. doi: 10.1107/S1600577516011917. Epub 2016 Aug 11.

Affiliations

¹ Australian Synchrotron, 800 Blackburn Road, Clayton, Victoria 3168, Australia.
² ARC Centre of Excellence in Advanced Molecular Imaging, La Trobe Institute for Molecular Sciences, La Trobe University, Victoria 3086, Australia.
³ Department of Chemistry and Physics, La Trobe Institute for Molecular Science, La Trobe University, Victoria 3086, Australia.
⁴ X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA.
⁵ Mathematics and Computer Science Division, Argonne National Laboratory, Argonne, IL 60439, USA.
⁶ CSIRO Manufacturing, Clayton, Victoria 3168, Australia.

PMID: 27577770
DOI: 10.1107/S1600577516011917

Abstract

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

Keywords: X-ray fluorescence; ptychography; scanning X-ray diffraction microscopy.

Publication types

Research Support, Non-U.S. Gov't